Brochures

• Available soon

Articles

• D. Windover, D.L. Gil, J.P. Cline, A. Henins, N. Armstrong, P.Y. Hung, S.C. Song, R. Jammy, and A. Diebold, NIST method for determining model-independent structural information by X-ray reflectometry, Proceedings of the Frontiers of Characterization and Metrology for Nanoelectronics Conference (forthcoming 2007).

Posters

• D. Windover, D.L. Gil, J.P. Cline, et al., NIST method for determining model-independent structural information by X-ray reflectometry, Frontiers of Characterization and Metrology for Nanoelectronics 2007. Pdf (poster format), pdf (slide format).